Direct measurements of air layer profiles under impacting droplets using high-speed color interferometry

arΧiv
Physical Review E 85, 026315 (2012)

Authors

Roeland van der Veen
Tuan Tran
Detlef Lohse
Chao Sun

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The 32nd International Conference on High-Speed Imaging and Photonics ICHSIP-32

Max Planck Gesellschaft
MCEC
Twente
Centre for Scientific Computing
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