Measuring thin films using quantitative frustrated total internal reflection (FTIR)

European Physical Journal E 40, 54 (2017)

Authors

Minori Shirota
Michiel van Limbeek
Detlef Lohse
Chao Sun

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The 32nd International Conference on High-Speed Imaging and Photonics ICHSIP-32

Max Planck Gesellschaft
MCEC
Twente
Centre for Scientific Computing
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