Measuring thin films using quantitative frustrated total internal reflection (FTIR)

European Physical Journal E 40, 54 (2017)

Authors

Minori Shirota
Michiel van Limbeek
Detlef Lohse
Chao Sun

BibTeΧ

Original
Standardized
Standardized short

Rayleigh Benard convection conference 2018 rbc2018

Max Planck Gesellschaft

MCEC

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